飞行时间二次离子质谱在锂基二次电池中的应用
Application of time-of-flight secondary ion mass spectrometry in lithium-based rechargeable batteries
飞行时间二次离子质谱在锂基二次电池中的应用 |
| 赵志伟, 杨智, 彭章泉 |
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Application of time-of-flight secondary ion mass spectrometry in lithium-based rechargeable batteries |
| Zhiwei ZHAO, Zhi YANG, Zhangquan PENG |
| 图1 二次离子质谱(SIMS)分析原理：(a) SIMS一次离子源；(b) 一次离子束在溅射过程中撞击样品表面，产生二次离子；(c) 二次离子通过飞行管或四极杆实现分离[ |
| Fig. 1 Principles of secondary ion mass spectrometry (SIMS) analysis: (a) SIMS primary ion beam: positive ions or negative ions; (b) the primary ion beam strikes the sample surface during sputtering and then produces secondary ions; (c) secondary ions are accelerated towards the detector, either through a flight tube (ToF-SIMS) or through magnetic separation using a quadrupole (NanoSIMS)[ |
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