固体电解质缺陷化学分析：晶粒体点缺陷及晶界空间电荷层
Defect chemistry analysis of solid electrolytes： Point defects in grain bulk and grain boundary space-charge layer
固体电解质缺陷化学分析：晶粒体点缺陷及晶界空间电荷层 |
| 邓诗维, 吴剑芳, 时拓 |
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Defect chemistry analysis of solid electrolytes： Point defects in grain bulk and grain boundary space-charge layer |
| Shiwei DENG, Jianfang WU, Tuo SHI |
| 图7 不同晶粒尺寸LLTO固体电解质的(a) 晶粒体和晶界电导率随温度变化曲线；(b) 晶粒体电导率和晶界电导率随晶粒尺寸变化曲线；(c) 晶界核电势随晶粒尺寸变化曲线；(d)，(e)，(f) 空间电荷层厚度及载流子浓度变化曲线[ |
| Fig. 7 (a) curves of grain body and grain boundary conductivity with temperature; (b) curves of grain body conductivity and grain boundary conductivity with grain size; (c) curves of grain boundary nuclear potential with grain size; (d), (e), (f) curves of space-charge layer thickness and carrier concentration of LLTO solid electrolytes with different grain sizes[ |
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