Internal short circuits (ISCs) in lithium-ion batteries (LIBs) lead to thermal runaway accidents. Therefore, diagnosing ISC faults in LIBs as early as possible is essential. However, the ISC resistance of LIBs in the early ISC fault stage is large, making it difficult to diagnose the microinternal short circuit (MISC) fault of LIBs. Herein, a fault diagnosis method is proposed for the MISC fault of LIBs based on the incremental capacity (IC) curve. When an MISC fault occurs in LIBs, a part of the charging current generates ohmic heat due to the presence of the short circuit resistance rather than participating in the electrochemical reaction of the LIB to increase the battery voltage. Consequently, the IC value of a short circuit battery is higher than that of a normal battery. Mean square error of the IC values of an MISC battery and a normal battery was calculated to evaluate the deviation, thereby diagnosing the MISC fault. Based on the differences between the charging capacities of MISC and normal batteries in the same voltage range, a quantitative calculation method was developed for MISC resistance. Simulation and experimental results showed that the proposed method could accurately detect MISC faults in batteries with a resistance of 710 Ω, and the maximum estimation error of the short-circuit resistance was 6.1%. Additionally, short-circuit experiments on aging batteries revealed that the proposed method was applicable for such batteries. The algorithm has low computational complexity and can be used for short-circuit fault diagnosis with just the charging data of low-rate batteries, which is easy for practical applications. The thermal effects of MISC faults in LIBs were also studied. The results demonstrated that the maximum temperature rise on the battery surface was 4.1 ℃ when the short circuit resistance was 100 Ω and 0.4 ℃ when it was 710 Ω. Temperature rise was not obvious when the MISC fault occurred in LIBs.
Keywords:lithium-ion battery
;
internal short circuit fault
;
incremental capacity curve
;
equivalent circuit model
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