俄歇电子能谱在锂离子电池分析中的应用

doi:10.19799/j.cnki.2095-4239.2024.0880

摘要/Abstract

摘要：

锂离子电池在研发和使用过程中，材料的表界面特性及其演变行为直接影响了电池的性能和应用。采用恰当的表面分析技术解析锂离子电池体系中表界面的组分、结构以及分布，有利于更好地探究界面性能优化，研究离子传输行为，以及分析电池失效机制。俄歇电子能谱(Auger electron spectroscopy, AES)是一种具有较高空间分辨率的电子束探针表面分析技术，可实现除H和He以外的大部分元素及其价态的定性和半定量分析，以及二维成像表征。本文介绍了俄歇电子能谱的技术原理、主要功能及分析方法，总结了其在锂离子电池研究中的应用案例及相关技巧，为AES表征技术在锂电池领域的广泛合理应用总结了经验，同时对AES技术在该领域的应用发展进行了展望。

关键词: 锂离子电池, 俄歇电子能谱, 表界面分析

Abstract:

The performance of lithium-ion batteries is significantly influenced by the characteristics and changes occurring at their surfaces and interfaces. Using appropriate surface analysis technologies to examine the composition, structure, and distribution of these interfaces is essential. Such analyses provide critical insights for optimizing interface performance, studying ion transport behaviors, and understanding battery failure mechanisms. Auger electron spectroscopy (AES) is a surface analysis technique that utilizes an electron beam probe, offering high spatial resolution. AES is capable of performing qualitative and semi-quantitative analyses of most elements, except H and He, and their oxidation states, along with providing two-dimensional imaging. This work introduces the technical principles, main functions, and analysis methods of Auger electron spectroscopy, while also reviews its application cases in lithium batteries. It summarizes the experience gained from employing AES in this field and explores potential advancements for its application in lithium battery technology.

Key words: lithium-ion batteries, Auger electron spectroscopy, surface interface analysis

中图分类号:

TH 842

张建茹, 王其钰, 姬瑛卉, 高鑫, 禹习谦, 李泓. 俄歇电子能谱在锂离子电池分析中的应用[J]. 储能科学与技术, 2025, 14(2): 755-769.

Jianru ZHANG, Qiyu WANG, Yinghui JI, Xin GAO, Xiqian YU, Hong LI. Application of Auger electron spectroscopy in the analysis of lithium-ion batteries[J]. Energy Storage Science and Technology, 2025, 14(2): 755-769.

图/表 10

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表面谱学表征技术	EDS (SEM)	XPS	AES	(TOF) SIMS
全称	Energy dispersive x-ray spectroscopy	X-ray photoelectron spectroscopy	Auger electron spectroscopy	（Time of flight）Secondary ion mass spectroscopy
中文名称	能量色散X射线光谱仪	X射线光电子能谱	俄歇电子能谱	(飞行时间)二次离子质谱
入射源	电子	X射线	电子	离子(一般为Bi源)
检测信号	X射线	电子	电子	离子(二次离子)
最小分析区域(直径)	约1 μm	>10 μm	约20 nm	约70 nm
检测深度(最小)	约1 μm	约6 nm	≤5 nm	<1 nm
深度剖析	需匹配FIB	√(Ar 溅射)	√(Ar 溅射)	√(Ar，O，Cs，GCIB等多种溅射)
二维成像	√	×	√	√
三维成像	×	×	×	√
最低检测限	约0.5%	约0.05%	约0.1%	约0.0001%
检测元素	B～U	Li～U	Li～U	H～U
样品类型	导体(可喷金)	导体、绝缘体	导体	固体
定量分析	一般	优	半定量	半定量

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